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Scan chain
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51	ITC Special Section Improving Transition Delay Test Using a Hybrid Method Nisar Ahmed and Mohammad Tehranipoor University of Connecticut Add to Reading List Source URL: www.engr.uconn.edu Language: English - Date: 2006-10-11 11:31:47 Electronic design automation Scan chain Automatic test pattern generation Electronic design Iddq testing Fault coverage Electronics manufacturing Design for testing Boundary scan Electronic engineering Electronics Integrated circuits
52	Fact Sheet Fujitsu Revenue Management Solution Fact Sheet Fujitsu Revenue Management Solution for the Wholesale Distribution Industry Fujitsu Revenue Management Solution manages end to end supply chain management. This Add to Reading List Source URL: solutions.us.fujitsu.com Language: English - Date: 2012-09-18 20:05:29 Fujitsu Scan-based trading Oracle Corporation Oracle Database Glovia Services Inc Computing Technology Software
53	lefttopINSTRUCTIONS After this form is signed and dated, please scan and upload to the FRYSC Green System along with any accompanying documentation. Please email your RPM to notify him/her that you have uploaded a docum Add to Reading List Source URL: www.chfs.ky.gov Language: English - Date: 2014-11-20 07:02:56 Manufacturing Operations research Purchasing Supply chain management Systems engineering Business Technology Procurement
54	lefttopINSTRUCTIONS After this form is signed and dated, please scan and upload to the FRYSC Green System along with any accompanying documentation. Please email your RPM to notify him/her that you have uploaded a docum Add to Reading List Source URL: chfs.ky.gov Language: English - Date: 2014-10-28 02:46:56 Manufacturing Operations research Purchasing Supply chain management Systems engineering Business Technology Procurement
55	P1581 Status and Technical update Frans de Jong, Leon van de Logt Philips Research Prof.Holstlaan 4, 5656AA Eindhoven The Netherlands Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2002-08-29 03:51:00 Electronics Joint Test Action Group Boundary scan Scan chain Test engineer Universal Serial Bus Verilog In-circuit test Electronics manufacturing Electronic engineering Manufacturing
56	STATIC COMPONENT INTERCONNECTION TEST TECHNOLOGY IN PRACTICE Frans de Jong, Rob Raaijmakers Philips Research, Philips CFT, The Netherlands Email: [removed], [removed] Steffen Hellmold Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2001-07-23 12:55:02 Electronics manufacturing Electronic design automation Boundary scan Hardware description languages Joint Test Action Group Design for testing Scan chain Synchronous dynamic random-access memory XNOR gate Electronic engineering Manufacturing Electronics
57	152406096000Montana Secretary of State Linda McCulloch Elections and Government Services Sos.mt.gov [removed] BALLOT RECONCILIATION/CHAIN OF CUSTODY AND SAMPLE CHECKLIST Add to Reading List Source URL: sos.mt.gov Language: English - Date: 2014-02-03 12:47:54 Absentee ballot Government Accountability Ballot Voting machine Optical scan voting system Provisional ballot Elections Politics Electronic voting
58	SMALL BUSINESS Doing Business with Government Project SMALL BUSINESS AND GOVERNMENT PROCUREMENT Scan of National and International Initiatives Add to Reading List Source URL: www.jtst.gov.bc.ca Language: English - Date: 2014-02-21 17:30:47 Procurement Systems engineering Electronic commerce Government procurement E-procurement Government procurement in the United States Reverse auction Purchasing Service-Disabled Veteran-Owned Small Business Business Supply chain management Technology
59	White Paper Testing Low Power Designs with Power-Aware Test Manage Manufacturing Test Power Issues with DFTMAX™ and TetraMAX® April 2010 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:31:30 Integrated circuits Electronic design Automatic test pattern generation Scan chain Power gating Electronic design automation Power supply Iddq testing Application-specific integrated circuit Electronic engineering Electronics Design
60	White Paper Synthesis-Based Test for Maximum RTL Designer Productivity November 2010 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:32:21 Electronic design Integrated circuits Electronics manufacturing Automatic test pattern generation Design closure Test compression Physical design Scan chain Timing closure Electronic engineering Electronic design automation Electronics